Dynamic Two-Dimensional Infrared Spectroscopy. Part I: Melt-Crystallized Nylon 11

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Two-dimensional FT-IR spectroscopy has been used to study the N-H stretching and amide I/amide II region of melt-crystallized nylon 11 thin films on TeflonĀ® substrates. Samples are dynamic mechanically oscillated at room temperature at a frequency of 11 Hz. A two-dimensional correlation analysis on the dynamic spectra indicates that the N-H stretching region splits into two peaks. Analysis of two-dimensional crossplots between the N-H stretching region and the amide I/amide II region shows that the prominent peak in the N-H stretching region (~3300 cm-1) is similar in morphological character to the ordered peak of the amide I region. The amide II region resolves into two-ordered and one-disordered peak.

Keywords: Dynamic two-dimensional FT-IR; Nylon 11; Step-scanning interferometry

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702953965001

Affiliations: Department of Mechanics and Materials Science, College of Engineering, Busch Campus, P.O. Box 909, Rutgers University, Piscataway, New Jersey 08855

Publication date: August 1, 1995

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