Nondestructive Optical Depth Profiling in Thin Films through Robust Inversion of the Laser Photopyroelectric Effect Impulse Response
Authors: Power, J.F.; Prystay, M.C.
Source: Applied Spectroscopy, Volume 49, Issue 6, Pages 12A-20A and 691-860 (June 1995) , pp. 725-746(22)
Publisher: Society for Applied Spectroscopy
Abstract:
The laser photopyroelectric effect measures an optical absorption depth profile in a thin film through the spatial dependence of a heat flux source established below the film surface by light absorption from a short optical pulse. In this work, inverse depth profile reconstruction was achieved by means of an inverse method based on the expectation-minimum principle (as reported in a companion paper), applied in conjunction with a constrained least-squares minimization, to invert the photopyroelectric theory. This method and zero-order Tikhonov regularization were applied to the inversion of experimental photopyroelectric data obtained from samples with a variety of discrete and continuous depth dependences of optical absorption. While both methods were found to deliver stable and accurate performance under experimental conditions, the method based on the constrained expectation-minimum principle was found to exhibit improved resolution and robustness over zero-order Tikhonov regularization.Keywords: Photopyroelectric photothermal inverse problem the
Document Type: Research article
DOI: http://dx.doi.org/10.1366/0003702953964570
Affiliations: 1: Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada
Publication date: 1995-06-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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