Curve Fitting and Deconvolution of Instrumental Broadening: A Simulated Annealing Approach
Abstract:A curve-fitting procedure based on the simulated annealing algorithm has been developed for the analysis of spectral Raman data. By the inclusion of a priori information about the instrumental broadening in the definition of the cost function that is minimized, effects of the finite instrumental resolution are eliminated from the resulting fit. The ability of the method to reproduce original band shapes is tested on synthesized spectra and FT-Raman spectra of diamond recorded at different resolutions with different apodization functions. The procedure yields the global optimum of the fitted parameters and is easily implemented on a personal computer.
Document Type: Research Article
Affiliations: Department of Physics, University of Umeå, S-901 87 Umeå, Sweden
Publication date: March 1, 1995
More about this publication?
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
- Editorial Board
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Membership Information
- Request copyrighted SAS materials
- Spectroscopic Nomenclature
- Focal Point (Open Access)
- ingentaconnect is not responsible for the content or availability of external websites