Near-IR Spectroscopic Examination of Thin-Layer Chromatography Plates in the Diffuse Transmittance Mode
Abstract:The nondestructive detection of analyte spots on high-performance thin-layer chromatography (HPTLC) plates is demonstrated with the use of near-IR spectrometry (NIRS). The resulting hyphenated technique is called Thin-Layer Chromatography-Near-Infrared Spectrometry (TLC-NIRS). A transmittance geometry is employed, and a set of 18 interference filters is used for wavelength selectivity. Plate-thickness nonuniformity and varying amounts of water vapor adsorption onto the silica-gel TLC plates were found to be the major complications. Variations in silica-gel thickness could be compensated for by obtaining reference spectral scans of the HPTLC plates before performing the chromatography. The effects of water-vapor adsorption were reduced through use of a partial least-squares calibration model. Detection limits near 1 μg were obtained.
Document Type: Research Article
Affiliations: Department of Chemistry, Indiana University, Bloomington, Indiana 47405
Publication date: March 1, 1994
More about this publication?
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
- Editorial Board
- Information for Authors
- Submit a Paper
- Subscribe to this Title
- Membership Information
- Request copyrighted SAS materials
- Spectroscopic Nomenclature
- Focal Point (Open Access)
- ingentaconnect is not responsible for the content or availability of external websites