XeCl Excimer Laser-Induced Shock Wave Plasma and Its Application to Emission Spectrochemical Analysis
Authors: Kagawa, K.1; Kawai, K.1; Tani, M.2; Kobayashi, T.3
Source: Applied Spectroscopy, Volume 48, Issue 2, Pages 167-278 (February 1994) , pp. 198-205(8)
Publisher: Society for Applied Spectroscopy
Abstract:
A XeCl excimer laser (20 ns, 15-70 mJ) has been focused on a Zn plate in surrounding gas at low pressures (100-1500 Pa). The characteristics of the resultant plasma are examined with the use of a unique time-resolved spectroscopic method. A density jump in the distribution of Zn atoms is clearly observed, which indicates the generation of a shock wave. Furthermore, it is proved that the relationships among the displacement length of the front of the emission of the Zn neutral emission line, the pressure of the ambient gas, and the energy of the laser pulse are in good agreement with the theoretical result for a blast wave explosion. An application is also presented to show that the plasma induced by a blast wave is excellent as a light source for emission spectrochemical analysis because of its very low background emission intensity.Keywords: Laser-induced shock wave; Laser plasma; Emission spectrochemical analysis; XeCl excimer laser
Document Type: Research article
DOI: http://dx.doi.org/10.1366/0003702944028551
Affiliations: 1: Department of Physics, Faculty of Education, Fukui University, Fukui 910, Japan 2: Michimori High School, Wakasugi, Fukui 910, Japan 3: Department of Electrical and Electronic Engineering, Faculty of Engineering, Fukui University, Fukui 910, Japan
Publication date: 1994-02-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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- By this author: Kagawa, K. ; Kawai, K. ; Tani, M. ; Kobayashi, T.

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