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Enhancement of Total Reflection X-Ray Fluorescence Spectroscopy with Electrochemical Deposition

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Abstract:

An electrodeposition preconcentration technique was used in conjunction with total reflection x-ray fluorescence (TRXRF) analysis. Fnhancement in sensitivity on the order of 103 was realized for the ions investigated here. In addition, x-ray scattering was reduced and a degree of selectivity was achieved by the electrodeposition. The results suggest that trace elemental analysis (sub-ppb level) with chemical speciation capability is feasible by using TRXRF with a conventional x-ray source.

Keywords: Concentration technique; Electrodeposition; Total reflection x-ray fluorescence

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702934066064

Affiliations: 1: Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113, Japan; mailing address: Room 518, Daishiryo, 5-3 Daishi Honcho, Kawasaki-Ku, Kawasaki City 210, Japan 2: Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo, Tokyo 113, Japan

Publication date: November 1, 1993

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