Structure of Ice Layers on Electrical Transmission Cables with Raman Microprobe Spectroscopy

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Abstract:

An icing chamber employing a closed-cycle helium cryostat has been fabricated for Raman microprobe spectroscopy of the icing on electrical transmission cable samples. A thick layer of ice deposited on a cable sample at low temperature (30 K) evaporates gradually under vacuum by increasing the temperature at intervals of 10 K up to 180 K. The Raman spectra of the gradually thinning ice layer obtained in the O-H stretching region reveals the layer-by-layer structure of ice. The study suggests that the structure of the initial ice changes from low-density amorphous ice at low temperatures to high-defect-density polycrystalline ice at higher temperatures. This observation, made for the first time on electrical transmission cable samples, is consistent with the observed phase diagram of bulk amorphous ice.

Keywords: Ice mechanics and physics; Physical vapor deposition; Raman spectroscopy

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702924123421

Affiliations: 1: Massachusetts Institute of Technology, Room 1-346, Cambridge, Massachusetts 02139 2: Hawaii Institute of Geophysics, School of Ocean and Earth Science and Technology, University of Hawaii at Manoa, 2525 Correa Road, Honolulu, Hawaii 96822

Publication date: December 1, 1992

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