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Crystalline silicon nitride (Si3N4) is of considerable interest commercially, e.g., as a passivating layer in the microelectronics industry and in the construction of advanced heat engines. The high-temperature, nitriding processes normally used in the manufacture
of this ceramic yield materials in which the ratio of the α- and β-Si3N4 polymorphic, crystalline modifications varies considerably depending on the actual synthetic conditions employed. Almost ten years ago, Luongo showed that IR spectroscopy could readily
be used for the rapid, quantitative identification of crystalline α- and β-Si3N4 in the presence of each other, despite the very close structural similarities between the two polymorphic phases. The IR method was based on determining the ratio of the absorbances
(I685/I578) of two characteristic marker bands which appear at 685 (α-Si3N4) and 578 cm−1 (β-Si3N4). A graph for determining the relative amounts of the two polymorphic phases in the
presence of each other in an unknown sample was published as part of Luongo's paper.
Department of Chemistry, McGill University, 801 Sherbrooke St. West, Montreal, Quebee H3A 2K6, Canada
Publication date: August 1, 1992
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)