Near-Infrared Raman Spectroscopy Using CCD Detection and a Semiconductor Bandgap Filter for Rayleigh Line Rejection

Author: Schulte, Alfons

Source: Applied Spectroscopy, Volume 46, Issue 6, Pages 891-1076 (June 1992) , pp. 891-893(3)

Publisher: Society for Applied Spectroscopy

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Abstract:

A novel application of a tuneable Ti: sapphire laser and a CdTe a Rayleigh line rejection filter for near-infrared Raman spectroscopy employing a single grating spectrograph and multichannel detection is demonstrated. Raman spectra of liquid, solid, and photobiological samples have been measured within 75 cm⁻¹ of the exciting laser line. At excitation wavelengths between 790 and 850 mm, a significant improvement in sensitivity over that for present Fourier transform Raman techniques has been obtained.

Keywords: Instrumentation, CCD; Lasers, Ti: sapphire; Raman spectroscopy

Document Type: Rapid communication

DOI: http://dx.doi.org/10.1366/0003702924124312

Affiliations: 1: Department of Physics and Center for Research in Electro-Optics and Lasers, University of Central Florida, Orlando, Florida 32816

Publication date: 1992-06-01

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