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Use of a Holographic Rejection Filter to Improve the Sensitivity of a Commercial Raman Microprobe

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The use of a holographic rejection filter has been demonstrated to improve the sensitivity of a commercial Raman microprobe by a factor of ∼3.5, allowing shorter data accumulation times or a reduction of the laser intensity at the sample. The filter has been tested with two very different solid samples; the first (TiO2 powder) gives a strong diffusely scattered laser beam along with the Raman scatter. The second (silicon) gives a strong specular reflection of the laser beam, again severely testing the laser rejection capabilities of the filter. Bands down to 200 cm−1 shift were transmitted by the filter without attenuation but with satisfactory rejection of the laser line. This approach provides a simple way of enhancing the performance of a commercial microprobe at low cost.

Keywords: Holographic rejection filter; Raman microscopy; Raman spectrometry

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702924124835

Affiliations: ICI plc, Wilton Materials Research Centre, P.O. Box 90, Wilton, Middlesbrough, Cleveland TS6 8JE, U.K.

Publication date: May 1, 1992

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