In Situ Measurements of Infrared Reflection Absorption and Emission Spectra of Oxide Film Formed on Chromium Metal at Temperatures up to 973 K

$29.00 plus tax (Refund Policy)

Buy Article:

Abstract:

An apparatus has been constructed for in situ measurements of infrared reflection absorption and emission spectra. Chromium metal oxidized at 973 K in air for 25 min was investigated at various temperatures up to 973 K. The frequencies of the bands shifted toward the lower wavenumber range with increasing temperature. In situ measurements were made for isothermal oxidation of chromium at 773 K.

Keywords: Chromium oxidation; IR emission spectrum; IR reflection absorption spectrum

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702924125140

Affiliations: 1: Research Laboratory of Engineering Materials, Tokyo Institute of Technology, 4259 Nagatsuta-cho, Midori-ku, Yokohama 227, Japan 2: Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguroku, Tokyo 152, Japan

Publication date: March 1, 1992

More about this publication?
Related content

Tools

Favourites

Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more