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Optical effects give rise to thickness-dependent positions of absorbance lines (v0) in the normal-incidence transmission spectra of thin films. Two reasons can be distinguished. Simple Fresnel refraction on the boundaries of the film shifts the line toward higher wavenumbers,
with the maximum increment at small film thicknesses (d). The second effect is due to multiple reflectance. The interference fringes cause the oscillations of the absorbance line around the mean value, which is defined by the effect of the boundaries. Both effects are more pronounced
for broad lines. Whereas for the strong bands the first effect dominates, for the weaker ones both can be seen. The effective dielectric constant of the medium increases the first effect and diminishes the second one. Theoretically predicted v0 (d) curves compare well
with absorption line positions in silicon nitride and silicon oxide films deposited on silicon wafers.
"Boris Kidrič" Institute of Chemistry, Hajdrihova 19, P.O. Box 30, YU-6115 Ljubljana, Slovenia
Publication date: February 1, 1992
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)