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Flow Injection Preconcentration Coupled with Direct Sample Insertion for Inductively Coupled Plasma Atomic Emission Spectrometry

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Abstract:

A flow injection (FI) preconcentration system has been coupled with a direct sample insertion (DSI) system for inductively coupled plasma atomic emission spectrometry (ICP-AES). The FI system provides a preconcentration factor of approximately 30. The DSI detection limit improvement, as compared to conventional nebulization detection limits, is element specific and ranges between 10 and 130 when a cup specifically designed for liquid work is used. The FI-DSI hybrid provides detection limit improvements ranging between 140 and 1200 for the elements tested—Cu, Pb, and Zn. Precision of the FI-DSI-ICP system averages 4% RSD for these three elements. FI processing time is 6.0 minutes with the use of 5-mL injection volumes. The system offers considerable potential for further improvement by increasing the injection volume and improving the interface to the DSI.

Keywords: Electrothermal vaporization; FIA; Flow injection; Furnace; ICP-AES; Ion exchange; Preconcentration; Sample introduction

Document Type: Rapid Communication

DOI: http://dx.doi.org/10.1366/0003702914335210

Affiliations: 1: Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada; present address: Ontario Ministry of the Environment, Resources Road, Rexdale, Ontario, Canada 2: Department of Chemistry, McGill University, 801 Sherbrooke St. W., Montreal, Quebec H3A 2K6, Canada

Publication date: December 1, 1991

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