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A Low-Cost Reflectance FT-IR Microscope

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A Fourier transform infrared spectroscopy (FT-IR) microscope combines microscopy with infrared (IR) spectroscopic molecular characterization. IR microspectroscopy presents a well-established and useful analytical tool, though at relatively high cost. A low-cost reflectance FT-IR microscope has been developed. The configuration consists of a diffuse reflectance cell, extended to include a diaphragm, a monocular, and an x-y-z stage in combination with an FT-IR spectrometer. The experimental setup is presented in detail. The assembly attains a spot size of 0.3 mm and detection limits in the nanogram range. The potentialities and applications of the low-cost reflectance FT-IR microscope are demonstrated by various examples in the field of polymeric material and product characterization.

Keywords: Infrared; Low-cost accessory; Microscopy; Polymers; Reflectance spectroscopy

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702914336002

Affiliations: 1: Philips PMF, Competence Centre Plastics, P.O. Box 218, 5600 MD Eindhoven, The Netherlands 2: University of Utrecht, Department of Analytical Molecule Spectrometry, Utrecht, The Netherlands 3: Delft University of Technology, Department of Polymers, Delft, The Netherlands

Publication date: August 1, 1991

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