Determination of the Wavelength Positioning Accuracy of a Sequential Scanning ICP Spectrometer

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This work evaluates the wavelength reproducibility and accuracy of a sequential scanning plasma emission system. The long-term thermal and thermomechanical errors are found to be in the range of a few picometers. The short-term instability and mechanical instability are found to contribute very little error to wavelength positioning. The wavelength calibration algorithm is described. Its use improves the accuracy by a factor of 5 to 10 by comparison with results from the use of the diffraction grating equation alone.

Keywords: ICP emission spectroscopy; Wavelength accuracy

Document Type: Research Article


Affiliations: The Perkin Elmer Corporation, 761 Main Avenue, Norwalk, Connecticut 06859-0219

Publication date: July 1, 1991

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