Thermal-induced infrared emission spectroscopy is reviewed, with emphasis on developments in theory and experiment. The theory associated with obtaining thermal-induced infrared emittance spectra as a function of sampling optics is discussed. The FT-IR configuration and data reduction
methods needed to properly obtain high-quality spectra, close to room temperature, are also considered. Optical and experimental parameters which affect the spectrum are demonstrated by example, with a discussion of methods which optimize the signal-to-noise ratio. The applications shown range
from polymer films on both metal and semiconductor surfaces to a single filament analyzed by micro-emission spectroscopy.
Texaco Research Center, Old Glenham Road, Beacon, New York 2:
Bio-Rad, Digilab Division, 237 Putnam Avenue, Cambridge, Massachusetts 02139
Publication date: May 1, 1991
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)