Design and Characterization of an Echelle Spectrometer for Fundamental and Applied Emission Spectrochemical Analysis

Authors: Scheeline, Alexander1; Bye, Cheryl A.1; Miller, Duane L.1; Rynders, Steven W.1; Owen, R. Calvin2

Source: Applied Spectroscopy, Volume 45, Issue 3, Pages 325-515 (March/April 1991) , pp. 334-346(13)

Publisher: Society for Applied Spectroscopy

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Abstract:

An echelle spectrometer has been constructed, which is optimized for use with a charge-coupled array detector, with dispersion and resolution appropriate for elemental analysis and plasma diagnostics. Design considerations, characterization, software, and initial experimental data are reported.

Keywords: CCD; Echelle spectrometer; Elemental analysis; Plasma diagnostics; Spectrometer design

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702914337083

Affiliations: 1: School of Chemical Sciences, University of Illinois, 1209 W. California St., Urbana, Illinois 61801 2: Optical Systems Division, Baird Corporation, 125 Middlesex Turnpike, Bedford, Massachusetts 01730-1468

Publication date: March 1, 1991

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