Fourier Transform Raman Spectroscopy Using a Tuneable Solid-State Laser and a Semiconductor Bandgap Filter

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Abstract:

The feasibility of using the optical absorption properties of a semiconductor crystal as a long wavelength pass filter for Fourier transform Raman spectroscopy applications has been demonstrated. Near-infrared excitation from a titanium: sapphire solid-state laser was selectively tuned to the edge of the bandgap absorption of an indium-doped cadmium telluride semiconductor filter. Raman spectra to within 30 cm−1 of the exciting line could be measured. Narrowing of the optical absorption of the semiconductor filter at low temperatures did not improve the "sharpness" of the cutoff performance.

Keywords: FT-Raman; Filter; Raman; Solid-state laser

Document Type: Rapid Communication

DOI: http://dx.doi.org/10.1366/0003702914337092

Affiliations: IBM Research Division, Almaden Research Center, 650 Harry Road, San Jose, California 95120-6099

Publication date: March 1, 1991

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