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Evaluation of a New Array Detector Atomic Emission Spectrometer for Inductively Coupled Plasma Atomic Emission Spectroscopy

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Abstract:

A unique echelle spectrometer system employing charge injection device (CID) array detector technology for use in inductively coupled plasma atomic emission spectroscopy (ICP-AES) is described. Due to improvements in optical design, this system offers increased wavelength coverage and improved light throughput over those of previous systems. Low sensitivity in the far-ultraviolet has been considered a major draw-back when silicon-based detectors are used, due to absorbance in the insulating SiO2 layer. The problem has been overcome through the use of a wavelength conversion phosphor. Therefore, detection limits comparable to those available with most commercial instruments have been obtained even in the far-UV. Operating parameters including precision, resolution, and background correction are also discussed. An analysis of the National Institute of Standards and Technology (NIST) Standard Reference Material (SRM) 1643b demonstrates that the system is capable of simultaneously determining at least 15 elements using 31 emission wavelengths with a high degree of accuracy.

Keywords: Atomic emission spectroscopy; Charge injection device; Charge transfer device; Echelle spectrometry; Inductively coupled plasma; Multichannel technique; Wavelength conversion phosphor

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702904417490

Affiliations: 1: Department of Chemistry, University of Arizona, Tucson, Arizona 85721 2: Thermo Jarrell Ash Corporation, 8E Forge Parkway, P.O. Box 9101, Franklin, Massachusetts 02038-9101 3: Creative Solutions, Box 368, Sandown, New Hampshire 03873

Publication date: December 1, 1990

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