Noise Characterization of a "Surfatron" MIP and the Implications for Fourier-Transform-Based Detection in GC-MIP-AES

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Abstract:

The noise amplitude spectra of a "Surfatron" microwave-induced plasma have been characterized. These are found to be similar to the noise amplitude spectra of conventional microwave plasmas sustained in TM010 cavities. Interference noises due to power line pickup and low-frequency 1/f noise extending to approximately 1 Hz are the major features observed on a largely white noise amplitude spectrum. The features observed in the noise amplitude spectra correlate well with the noise features in optical spectra of the source acquired by Fourier transform spectroscopy.

Keywords: Emission spectrometry; Fourier transform spectroscopy; Microwave plasma; Noise spectra; Surfatron

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702904417562

Affiliations: Département de Chimie, Université de Montréal, P.O. Box 6128, Station A, Montreal, Quebec, H3C 3J7, Canada

Publication date: December 1, 1990

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