Theory of a Double Polarization Modulated Martin-Puplett Interferometer

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We present a formal Jones matrix analysis of a new far-infrared spectrometer design based on the Martin-Puplett interferometer. The new spectrometer utilizes double polarization modulation and eliminates problems due to source fluctuations, instrumental drift, and reduced dynamic range in studies of materials with small absorptivities. The spectrometer has successfully extended the reflection-absorption technique of thin-film spectroscopy into the far-infrared and millimeter wave region.

Keywords: Far-infrared; Instrumentation; Polarization modulation; Spectroscopic techniques

Document Type: Research Article


Affiliations: 1: Department of Physics, University of California-Davis, Davis, California 95616; present address: Versatec/Xerox PARC, 3333 Coyote Hill Road, Palo Alto, CA 94304 2: Department of Physics, University of California-Davis, Davis, California 95616

Publication date: September 1, 1990

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