Principal Component Analysis of Trace Elements from EDXRF Studies

Authors: Yap, C.T.; Vijayakumar, V.

Source: Applied Spectroscopy, Volume 44, Issue 6, Pages 911-1096 (July 1990) , pp. 1080-1083(4)

Publisher: Society for Applied Spectroscopy

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Abstract:

With the use of the EDXRF technique, the concentrations of 14 trace elements (Mn, Fe, Co, Ni, Cu, Zn, Ga, As, Rb, Sr, Y, Zr, Nb, and Mo) of Japanese pottery samples from three different regions were measured. Principal component analysis shows the possibility of discriminating between the various trace elements in terms of their being either useful or not useful variables by which Japanese pottery samples could be grouped according to their geographical origin.

Keywords: X-ray fluorescence

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702904086812

Affiliations: 1: Department of Physics, National University of Singapore, Singapore 0511

Publication date: 1990-07-01

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