Nondestructive Determination of the Composition of High-Tc Superconducting Thin Films

$29.00 plus tax (Refund Policy)

Buy Article:


The purpose of this paper is to describe two methods for composition determination of superconducting thin films: (1) the multiple standards method, in which a set of filter disks is used, and (2) the fundamental parameters method, in which only one standard is used. The two methods are convenient and easy to apply. The disk standards can be prepared readily. It is not necessary to destroy the samples to be determined. The methods are applied to superconducting thin films of an yttrium series; the principle of these methods can be applied to the films of other series as well. The methods can coordinate the process of scientific research and production quickly.

Keywords: Filter standards; Superconducting film analysis; X-ray fluorescence spectroscopy

Document Type: Research Article


Affiliations: Institute of Physics, Academia Sinica, Beijing, People's Republic of China

Publication date: June 1, 1990

More about this publication?
Related content



Share Content

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more