Some Signal Characteristics in Direct Sample Insertion-Inductively Coupled Plasma-Atomic Emission Spectrometry

Authors: Chan, W. T.; Horlick, G.

Source: Applied Spectroscopy, Volume 44, Issue 3, Pages 351-535 (March/April 1990) , pp. 525-530(6)

Publisher: Society for Applied Spectroscopy

Buy & download fulltext article:

OR

Price: $29.00 plus tax (Refund Policy)

Abstract:

Direct sample insertion (DSI) is a particularly attractive method for sample introduction for inductively coupled plasma-atomic emission spectrometry (ICP-AES). In this approach a sample is placed into or onto a probe with subsequent introduction of the sample carrying probe, via the central tube of the torch, into the plasma. An extensive review of DSI devices for the ICP has been presented by Karanassios and Horlick.

Keywords: Inductively coupled plasma; Sample introduction

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/0003702904086191

Affiliations: Department of Chemistry, University of Alberta, Edmonton, Alberta T6G 2G2, Canada

Publication date: March 1, 1990

More about this publication?
Related content

Tools

Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content

Text size:

A | A | A | A
Share this item with others: These icons link to social bookmarking sites where readers can share and discover new web pages. print icon Print this page