A Versatile Analytical Method of Identifying Adhesive on Stamps by Specular-Reflectance Fourier Transform Infrared Spectroscopy

Author: Wang, Jin Hai

Source: Applied Spectroscopy, Volume 44, Issue 3, Pages 351-535 (March/April 1990) , pp. 447-450(4)

Publisher: Society for Applied Spectroscopy

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Abstract:

A specular-reflectance FT-IR spectroscopic technique has been applied to analyze the adhesives on stamps. The results show that it is better than the reported diffuse-reflectance technique, particularly in the suitability of sample size. The spectra of some used and unused stamps from several different countries were obtained; some exhibited apparent differences and some looked basically identical. The spectra of glues on the edge papers of stamps show the promising potential applications of this technique for other adhesive analysis of documents and books.

Keywords: Specular-reflectance FT-IR; Adhesive analysis; Stamps

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702904086317

Affiliations: 1: Department of Chemistry, Shanghai Teachers' University, 10 Kuilin Road, Shanghai, People's Republic of China; present address: Department of Chemistry, Imperial College of Science, Technology and Medicine, London SW7 2AY, U.K.

Publication date: 1990-03-01

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