Characterization of a High-Efficiency Helium Microwave-Induced Plasma as an Atomization Source for Atomic Spectrometric Analysis

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Characterization studies of a He high-efficiency microwave-induced plasma, He-HEMIP, utilizing direct sample introduction with pneumatic nebulization for atomic emission and atomic fluorescence spectrometry are presented. These studies include diagnostic measurements and analytical characterization of the 150-W He-HEMIP. Diagnostic measurements include excitation temperatures with the use of aqueous and organic nebulized thermometric species, electron number densities, and ionization temperatures for the plasma. The effect of sample uptake rate on the emission intensity is investigated. Ionization interferences are minimal, and phosphate interferences were found not to occur. In addition, the He-HEMIP is characterized as an atom source for metals and nonmetals with the use of atomic emission spectrometry and atomic fluorescence spectrometry. With AES, detection limits for metals and nonmetals are in the sub-ppm range. With AFS, detection limits for metals were determined to be in the low to sub-ppb range and were found to be not statistically different from those reported for HCL-ICP-AFS. Linear ranges for AES and AFS ranged from four up to five and one-half orders of concentrative magnitude.

Keywords: Atomic emission spectrometry; Atomic fluorescence spectrometry; Helium plasma; Metal determinations; Microwave-induced plasma; Nonmetal determinations; Solution nebulization

Document Type: Research Article


Affiliations: Department of Chemistry, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061

Publication date: March 1, 1989

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