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Spectroscopy of Matrices and Thin Films with an Integrating Sphere

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The paper describes a novel experimental approach to improving sensitivity to weak absorption in matrix isolation and thin film spectroscopy. The matrix or film is grown on the surface of an integrating sphere, in which the multiply reflected light correspondingly multipasses the sample film. The quantitative photometric behavior of the sphere is satisfactorily described by extending standard theory. Enhancement of absorption by a factor of at least 20 is possible and is demonstrated. The sphere has a number of useful advantages over other multipass techniques, particularly in matrix isolation spectroscopy.

Keywords: FT-IR; Integrating sphere; Matrix isolation; Spectroscopy; Thin films

Document Type: Research Article


Affiliations: 1: Max Planck Institute for Chemistry, Air Chemistry Department, Postfach 3060, D-6500 Mainz, F.R.G. 2: Department of Chemistry, University of Wollongong, P.O. Box 1144, Wollongong, NSW 2500, Australia

Publication date: February 1, 1989

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