Surface-Enhanced Raman Spectroscopy of CrO₃/H₂SO₄-Etched Polyethylene Films

Author: Siperko, Lorraine M.

Source: Applied Spectroscopy, Volume 43, Issue 2, Pages 185-354 (February 1989) , pp. 226-229(4)

Publisher: Society for Applied Spectroscopy

Buy & download fulltext article:

Price: $29.00 plus tax (Refund Policy)

Abstract:

The effects of chromic/sulfuric acid etchant on thin polyethylene films are being studied by Raman spectroscopy. The functional groups on the surface of the etched films were found to differ from those present in the bulk. Cr-O bands appeared in both the bulk and SERS spectra, and sulfate species were detected on the surface only. The ability to differentiate between the surface and bulk polymer chemistry of CrO₃/H₂SO₄-etched polyethylene using surface-enhanced Raman spectroscopy is demonstrated.

Keywords: SERS; Raman spectroscopy; Polyethylene; Chromic acid etchant

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702894203237

Affiliations: 1: IBM Systems Technology Division, Surface Raman Laboratory, Endicott, New York 13760

Publication date: 1989-02-01

More about this publication?

The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.

Previously published as Bulletin (Society for Applied Spectroscopy)
Editorial Board
Information for Authors
Submit a Paper
Subscribe to this Title
Membership Information
Request copyrighted SAS materials
Spectroscopic Nomenclature
Focus Compendium
ingentaconnect is not responsible for the content or availability of external websites