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A Simple Purge System for Determination of Sulfur Using the Direct-Current Plasma

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Abstract:

A significant limitation to the use of the direct-current plasma (DCP), for sulfur analysis is the inability of the echelle spectrometer system to operate effectively at wavelengths below 190 nm. This difficulty arises because the spectrometer is not calibrated below 190 nm, and because the intensities of these short wavelengths are severely attenuated by the echelle's prism. For these reasons, the determination of sulfur, which has strong emission in the 180–183 nm region, is not routinely performed by DCP emission spectrometry.

Keywords: DCP-AES; Purge systems; Sulfur determination

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702894201969

Affiliations: Department of Chemistry, Virginia Polytechnic Institute and State University, Blacksburg, Virginia 24061

Publication date: January 1, 1989

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