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FT-Raman Microscopy: Discussion and Preliminary Results

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Abstract:

This paper reports on the first spectra obtained using a microscope apparatus to perform FT-Raman spectroscopy. It is considered desirable to use a standard FT-IR microscope for these measurements, since this approach may lead to the attainment of both FT-IR and FT-Raman microscope data from a single instrument. The relative performance of the microscope apparatus compared to that of a previously designed macro-apparatus is studied. The described micro-apparatus is then used to measure the FT-Raman spectrum of a single crystal of bis-methyl-styrylbenzene and of a single fiber of Kevlar®. The results indicate an acceptable sensitivity, for these small samples.

Keywords: Instrumentation, FT-Raman; Optics; Raman spectroscopy; Spectroscopic techniques

Document Type: Rapid Communication

DOI: http://dx.doi.org/10.1366/0003702894201761

Affiliations: 1: Spectra-Tech, Inc., 652 Glenbrook Road, Stamford, Connecticut 06906; current address: Connecticut Instrument Corporation, 270 Main Avenue, Norwalk, CT 06851 2: E. I. DuPont deNemours, Experimental Station E-328, Wilmington, Delaware 19898

Publication date: January 1, 1989

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