Elemental Analysis with a Plasma Emission Echelle Spectrometer Employing a Charge Injection Device (CID) Detector

Authors: Bilhorn, R. B.1; Denton, M. B.2

Source: Applied Spectroscopy, Volume 43, Issue 1, Pages 1-178 (January 1989) , pp. 1-11(11)

Publisher: Society for Applied Spectroscopy

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An atomic emission spectrometer which allows simultaneous high-precision digital recording of the ultraviolet spectrum has been developed. The instrument employs both a custom-built echelle spectrometer and a custom-built slow-scan charge injection device (CID) based detector system. The system is capable of measuring the wide dynamic range of signal intensities associated with plasma emission sources, and sensitivity is comparable to that of photomultiplier-tube-equipped instruments. Unprecedented speed and flexibility for elemental analysis are provided by the ability to display background-subtracted emission spectra and to have the computer assist in spectral line identification. The design and performance of the optical system, methodologies for CID detector utilization in analytical spectroscopy, and techniques for wavelength calibration are presented. Examples for qualitative analysis and for the qualitative comparison of similar samples demonstrate the sensitivity, flexibility, and speed of the system.

Keywords: Atomic emission spectroscopy; Charge injection devices; Charge transfer devices; Direct-current plasma; Echelle spectrometry; Multichannel techniques

Document Type: Rapid Communication

DOI: http://dx.doi.org/10.1366/0003702894201716

Affiliations: 1: University of Arizona, Department of Chemistry, Tucson, Arizona 85721; present address: Eastman Kodak Company, Kodak Park 1-34, Rocher, NY 14652 2: University of Arizona, Department of Chemistry, Tucson, Arizona 85721

Publication date: January 1, 1989

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