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Comparison Between a TIAP Crystal and a PX1 Multilayer Pseudocrystal in Light Element X-Ray Fluorescence Emission Using Different Excitation Sources

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Abstract:

A PX1 multilayer pseudocrystal is compared with a TIAP crystal for the analysis of light elements by means of two different excitation sources, i.e., a chromium and a scandium target tube. Peak and background intensities for Cl, S, P, Si, Al, Mg, Na, F, and O are compared with the use of both a fine and a coarse collimator. The most suitable working conditions for the analysis are pointed out.

Keywords: X-ray fluorescence

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702884429238

Affiliations: 1: Italsider S.p.A., Genova, Italy 2: University of Genoa, Faculty of Engineering, Genoa, Italy 3: National Research Council I.C.F.A.M., Lungobisagno Istria, 34, I 16141 Genoa, Italy

Publication date: May 1, 1988

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