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Polarization-Modulation FT-IR Reflection Spectroscopy Using a Polarizing Michelson Interferometer

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We report the first results obtained on a mid-IR FT spectrometer equipped with a polarizing Michelson interferometer (PMI), and the application examples of polarization spectroscopy are illustrated. A relatively simple method for conversion of a conventional instrument to PMI operation is designed. Specular reflection spectra of poly(vinyl acetate) film on copper and ATR spectra of a Langmuir-Blodgett film on silicon prism are presented.

Keywords: Infrared; Instrumentation; Reflection spectroscopy; Spectroscopic techniques

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702874447167

Affiliations: 1: Department of Macromolecular Science, Case Western Reserve University, Cleveland, Ohio 44106, U.S.A. 2: Bomem Inc., 625 rue Marais, Vanier, Quebec G1M 2Y2, Canada 3: Department of Chemistry, University of Toronto, Toronto M5S 1A1

Publication date: November 1, 1987

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