The Multiplex Disadvantage and Excess Low-Frequency Noise

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Abstract:

Analysis of the performance of a Fourier transform spectrometer with respect to source shot and flicker noises is presented. It was found that source shot noise uniformly distributes throughout the baseline, whereas source flicker noise remains localized about the generating spectral region(s).

Keywords: Excess low-frequency noise; Fourier transform spectroscopy; Multiplex disadvantage; Shot noise

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702874447509

Affiliations: 1: Chemistry Department, University of Florida, Gainesville, Florida 32611; current address: LGRC-A, Chemistry Department, University of Massachusetts, Amherst, MA 01003 2: Chemistry Department, University of Florida, Gainesville, Florida 32611

Publication date: September 1, 1987

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