Characterization of Oxidized Nickel (II) Dimethylglyoxime Using X-Ray Photoelectron Spectroscopy

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Abstract:

X-ray photoelectron spectroscopy has been used to determine the oxidation state of nickel in the oxidized nickel (II) dimethylglyoxime complex. Core level binding energies for the Ni(2p), N(1s), and O(1s) levels; the presence or absence of shake-up satellites on the Ni(2p) levels; and the analysis of intensity data are consistent only with an assignment of +3. Structures consistent with the data are proposed for both the solid-and the solution-phase complexes.

Keywords: Oxidized nickel (II) dimethylglyoxime; Photoemission; X-ray photoelectron spectroscopy

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702874447842

Affiliations: 1: Department of Chemistry, University of Missouri-Kansas City, Kansas City, Missouri 64110; present address: Department of Chemistry, University of Florida, Gainesville, FL 32611 2: Department of Chemistry, University of Missouri-Kansas City, Kansas City, Missouri 64110; present address: Institute of Nuclear Energy Research, Lungtan Taiwan, Republic of China 3: Department of Chemistry, University of Missouri-Kansas City, Kansas City, Missouri 64110

Publication date: August 1, 1987

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