Effect of Easily Ionized Elements upon the Spatial Emission Properties of Microwave-Induced Plasmas
Authors: Selby, Mark; Rezaaiyaan, Ruhangiz; Hieftje, Gary M.
Source: Applied Spectroscopy, Volume 41, Issue 5, Pages 715-921 (July 1987) , pp. 761-771(11)
Publisher: Society for Applied Spectroscopy
Abstract:
Spatially resolved measurements of emission from microwave-induced plasmas (MIPs) sustained in helium in a Beenakker resonant cavity and in a surfatron have been compared and contrasted. Particular emphasis has been placed upon the study of a common interference effect in MIP sources, namely the enhancement (or suppression in some instances) of analyte emission intensity by matrices containing an easily ionized element (EIE). The presence of the EIE caused a strong enhancement of analyte emission in the Beenakker cavity system but had a relatively smaller influence upon analyte emission in the surfatron system at higher concentrations of EIE. The difference in behavior between the two systems toward EIEs appears to be attributable to improved sample injection into the plasma in the case of the surfatron.Keywords: Emission spectrometry; Microwave-induced plasma; Surfatron; Easily ionized elements; Spatially resolved emission
Document Type: Research article
DOI: http://dx.doi.org/10.1366/0003702874448328
Affiliations: 1: Department of Chemistry, Indiana University, Bloomington, Indiana 47405-4001
Publication date: 1987-07-01
- The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)
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