Inductively coupled plasma atomic emission spectrometry is increasingly relied upon for the analysis and characterization of metallurgical and related materials, from the raw material to the finished product. However, descriptions of the analysis of metal products related to the electronics
industry are scant.
Geochemical Division, Geological Survey of Israel, 30 Malkhe Israel Street, Jerusalem 95001 2:
Batteries Plant, Components Division, Tadiran Ltd., P.O. Box 74, Rehovoth 76100, Israel
Publication date: February 1, 1987
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)