The Application of Inductively Coupled Plasma Atomic Emission Spectrometry and a Sequential Spectrometer for Thallium Determination in Cadmium Anodes

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Abstract:

Inductively coupled plasma atomic emission spectrometry is increasingly relied upon for the analysis and characterization of metallurgical and related materials, from the raw material to the finished product. However, descriptions of the analysis of metal products related to the electronics industry are scant.

Keywords: Analysis for thallium in cadmium; Analytical methods; Emission spectroscopy; ICP-AES; Spectroscopic techniques

Document Type: Short Communication

DOI: http://dx.doi.org/10.1366/000370287774986796

Affiliations: 1: Geochemical Division, Geological Survey of Israel, 30 Malkhe Israel Street, Jerusalem 95001 2: Batteries Plant, Components Division, Tadiran Ltd., P.O. Box 74, Rehovoth 76100, Israel

Publication date: February 1, 1987

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