Authors: Albers, D.¹; Tisack, M.²; Sacks, R.²

Source: Applied Spectroscopy, Volume 41, Issue 1, Pages 1-165 (January 1987) , pp. 131-139(9)

Publisher: Society for Applied Spectroscopy

Abstract:

A magnetic field of a few kilogauss oriented normal to the electric field in the plasma generated by a capacitive discharge through a thin silver film is used to obtain an ExB drift motion of the plasma. The plasma current is used to generate the magnetic field in a coil surrounding the plasma. The plasma drift motion is used to confine the plasma to the region near the surface of the plastic substrate which originally supported the thin film and the powder or solution residue sample. The result is greater interaction of the plasma with the sample, as illustrated by more rapid vaporization of the sample, reduced effects of particle size on analyte radiation intensity, and significantly improved shot-to-shot reproducibility. While analyte line intensities frequently are lower in the ExB plasma, line-to-background intensity ratios may be greater if an optical mask is used to block radiation near the substrate surface.

Keywords: Emission spectroscopy; Magnetic fields; Solid samples; Particle size effects

Document Type: Research article

DOI: http://dx.doi.org/10.1366/0003702874867972

Affiliations: 1: Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109; present address: Dow Chemical Co., Midland, MI 48640 2: Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109

Publication date: 1987-01-01

More about this publication?

• The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge.
  
  Previously published as Bulletin (Society for Applied Spectroscopy)
• Editorial Board
• Information for Authors
• Submit a Paper
• Subscribe to this Title
• Membership Information
• Request copyrighted SAS materials
• Spectroscopic Nomenclature
• Focus Compendium
• ingentaconnect is not responsible for the content or availability of external websites

Related content

• In this: publication
• By this: publisher
• In this Subject: Analytical Chemistry
• By this author: Albers, D. ;  Tisack, M. ;  Sacks, R.

Website © Publishing Technology. Article copyright remains with the publisher, society or author(s) as specified within the article.

• Terms and conditions
• Privacy policy
• Information for advertisers