Detection of Spectral Overlap Interference in ICP-AES with an Empirical Linewidth Ratio Technique

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ICP-AES line intensity data were fitted to a minimum-curvature smooth curve generated with the aid of a cubic semispline algorithm. These spline-fitted curves were used to obtain linewidth ratios which can provide accurate indication of spectral overlap with the use of only sample and standard spectra.

Keywords: Emission spectroscopy

Document Type: Research Article


Affiliations: Department of Chemistry, University of Idaho, Moscow, Idaho 83843

Publication date: September 1, 1986

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