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Characterization of Near-Infrared Nonmetal Atomic Emission from an Atmospheric Helium Microwave-Induced Plasma Using a Fourier Transform Spectrophotometer

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A new approach for using Fourier transform spectroscopy (FTS) for the detection of atomic emission from an atmospheric helium plasma has been developed and the results obtained are described. Among the different types of plasma source available, the atmospheric pressure microwave helium plasma appears to be an efficient excitation source for the determination of nonmetal species. The more complete microwave plasma emission spectra of Cl, Br, I, S, O, P, C, N, and He in the near-infrared region were obtained and their corrected relative emission intensities are reported. This makes qualitative identification simple, and aids in the quantitative analysis of atomic species. The accuracy of the emission wavelengths obtained with the Fourier transform spectrophotometer was excellent and the resolution provided by the FTS allowed certain adjacent emission lines to be resolved. These atomic emission lines were found to be adequate for analytical applications.

Keywords: Emission spectroscopy; Instrumentation, emission spectroscopy; Interferometry, NIR region

Document Type: Research Article


Affiliations: 1: Department of Chemistry, University of Montreal, P.O. Box 6128, Station A, Montreal, Quebec, Canada H3C 3J7 2: Bomem Inc., 625 Marais, Vanier, Quebec, Canada G1M 2Y2

Publication date: August 1, 1986

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