Photothermal Deflection Densitometer with Pulsed-UV Laser Excitation

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First application of pulsed photothermal deflection spectroscopy to solid samples is demonstrated. A new densitometer for thin layer chromatography based on this method is described. The technique is suitable for direct measurements in the ultraviolet region. A pulsed excimer laser is used to produce a transient thermal refractive index gradient. The laser delivers pulses of 1-2 mJ at 10-22 pulses/s, at 351 nm. With this system the detection limit for 2,4-dinitroaniline is 750 pg. The signal is linear with amount of analyte for about three orders of magnitude.

Keywords: Excimer laser; Photothermal deflection spectroscopy; Thin layer chromatography

Document Type: Research Article


Affiliations: Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109

Publication date: July 1, 1986

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