First application of pulsed photothermal deflection spectroscopy to solid samples is demonstrated. A new densitometer for thin layer chromatography based on this method is described. The technique is suitable for direct measurements in the ultraviolet region. A pulsed excimer laser
is used to produce a transient thermal refractive index gradient. The laser delivers pulses of 1-2 mJ at 10-22 pulses/s, at 351 nm. With this system the detection limit for 2,4-dinitroaniline is 750 pg. The signal is linear with amount of analyte for about three orders of magnitude.
Department of Chemistry, University of Michigan, Ann Arbor, Michigan 48109
Publication date: July 1, 1986
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The Society publishes the internationally recognized, peer reviewed journal, Applied Spectroscopy, which is available both in print and online. Subscriptions are included with membership or can be purchased by institutional or corporate organizations. Abstracts may be viewed free of charge. Previously published as Bulletin (Society for Applied Spectroscopy)