@article {Beduhn:1986:0003-7028:628,
	author = "Beduhn, Donald L. and White, Robert L.",
	title = "Advantages of Dual-Beam Interferometry in Fourier Transform Infrared Spectrometry",
	journal = "Applied Spectroscopy",
	volume = "40",
	number = "5",
	year = "1986",
	abstract = "A dual-beam Fourier transform infrared spectrometer (FT-IR) is described. Sensitivity improvement, photometric accuracy, and instrument stability are evaluated by comparing dual-beam spectra with conventional single-beam spectra. Dual-beam FT-IR data acquisitions require an order of magnitude less measurement time than single-beam acquisitions for spectra of comparable signal-to-noise ratios. Application of dual-beam FT-IR for analysis of a highly transmitting sample is discussed. Single fiber analysis without masking and without an infrared microscope is described.",
	pages = "628-632",
	url = "http://www.ingentaconnect.com/content/sas/sas/1986/00000040/00000005/art00008",
	doi = "doi:10.1366/0003702864508520",
	keyword = "FT-IR, Dual-beam FT-IR, Dual-beam interferometry"
}