The ODD OVER EVEN Test for FT-IR Interferometers

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Abstract:

Timing and intensity nonlinearities are highlighted with a new test for FT-IR instruments.

Keywords: Analytical methods; Infrared; Interferometry, IR region

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702854249385

Affiliations: IBM Instruments, Inc., 5600 Cottle Road, San Jose, California 95793

Publication date: November 1, 1985

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