Skip to main content

Device for Simple, Precise Alignment of Bilateral Slits

Buy Article:

$29.00 plus tax (Refund Policy)

Abstract:

Pronounced misalignment of a nominally 10-micronwidth fixed bilateral spectrometer slit brought to our attention the need to conveniently monitor and realign these important spectrometer components. While it is possible to do such realignment manually under a microscope, such an approach is time-consuming, awkward, and imprecise. A simple procedure for measuring slit width, based on diffraction of laser radiation, has been previously reported. Here we describe a simple alignment jig which allows submicron adjustment of slit jaws for parallelism and width. Visual indication of the width achieved is continuously available during the adjustment. The slit jaws are moved with differential screws. A translation stage allows sequential adjustment of alternate ends of the slit, ensuring parallelism.

Keywords: Instrumentation, spectroscopy; Slits

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702854248638

Affiliations: 1: School of Chemical Sciences, University of Illinois, 1209 W. California Ave., Urbana, Illinois 61801 2: State Geological Survey Division, Illinois Dept. of Energy and Natural Resources, Champaign, Illinois 61820 and College of Veterinary Medicine, University of Illinois, Urbana, Illinois 61801

Publication date: May 1, 1985

More about this publication?
sas/sas/1985/00000039/00000003/art00034
dcterms_title,dcterms_description,pub_keyword
6
5
20
40
5

Access Key

Free Content
Free content
New Content
New content
Open Access Content
Open access content
Subscribed Content
Subscribed content
Free Trial Content
Free trial content
Cookie Policy
X
Cookie Policy
ingentaconnect website makes use of cookies so as to keep track of data that you have filled in. I am Happy with this Find out more