Interferometric Detection of Near-Infrared Nonmetal Atomic Emission from a Microwave-Induced Plasma

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Abstract:

A feasibility study has coupled a helium microwave-induced plasma (MIP) and a commercial Fourier transform infrared spectrometer for nonmetal determination. In the He MIP, compounds containing nonmetal atoms are fragmented and the resulting atoms excited. Strong nonmetal emission from such elements as C, N, and O then appears on a weak, relatively unstructured plasma background in the near-infrared region (800-2000 nm). Results are sufficiently promising that continuing studies are suggested, involving both dispersive and multiplex spectrometers.

Keywords: Emission spectroscopy; Instrumentation, emission spectroscopy; Interferometry, FT-NIR region; Near-infrared; Techniques, spectroscopic

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702854248818

Affiliations: Department of Chemistry, Indiana University, Bloomington, Indiana 47405

Publication date: March 1, 1985

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