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Fourier Transform Spectrometry in the Far-Infrared to High-Microwave Spectral Region Using a Rapid-Scan Interferometer

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Abstract:

An experimental set-up, based on a commercial rapid-scan Fourier transform spectrometer, for dielectric loss measurements on low-loss materials in the frequency region between 120 GHz and 1650 GHz (455 cm−1) is described. Results obtained for cyclohexane are presented as an example of application.

Keywords: Dielectric loss; Far infrared; Fourier transform spectrometry

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702844554873

Affiliations: Physikalisch-Technische Bundesanstalt, Braunschweig, Federal Republic of Germany

Publication date: September 1, 1984

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sas/sas/1984/00000038/00000005/art00011
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