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Characterization and Use of the Silicon Intensified Target Vidicon Detector in Basic and Applied Research in Atomic Spectroscopy

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Abstract:

In this paper we briefly discuss the operation of the silicon intensified target (SIT) vidicon, describing what we conclude to be the most important properties of the detector. We provide experimental evaluation of the SIT vidicon characteristics, including two-dimensional image fidelity, channel-to-channel and pixel-to-pixel response as a function of position on the detector, and temporal resolution and gating. We illustrate how these unique properties enhance our ability to make spectroscopic measurements, as well as how, at the same time, they impose limitations on the use of the SIT vidicon. We describe a variety of experiments which employed an SIT vidicon detection system for atomic spectroscopy with various degrees of spatial and temporal resolution.

Keywords: Instrumentation, optical spectroscopy; Multichannel detectors; Silicon intensified target vidicon; Space-resolved spectroscopy; Time-resolved spectroscopy; Vidicon

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702844555089

Affiliations: 1: Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706; present address: Department of Chemistry, University of North Carolina at Chapel Hill, Chapel Hill, NC 27514 2: Department of Chemistry, University of Wisconsin-Madison, Madison, Wisconsin 53706; present address: Department of Chemistry, St. Olaf College, Northfield, MN 55057

Publication date: July 1, 1984

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