Determination of Boron in Silicate Geological Material by an Emission Spectrographic Method

Authors: Baucells, M.1; Lacort, G.1; Roura, M.1; Rauret, G.2

Source: Applied Spectroscopy, Volume 38, Issue 4, Pages 471-605 (July/August 1984) , pp. 572-574(3)

Publisher: Society for Applied Spectroscopy

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A spectrographic method has been developed to determine boron in silicate geological materials. Its basis is the use of a mixture (97.3%:2.0%:0.7%) of graphite, gallium oxide, and germanium dioxide as internal standard, and the use of the 249.677 nm line to avoid interference of the SiO band. Standards were prepared by diluting 1:1 the synthetic glass VS-N (ANRT) with a synthetic silicate matrix. The precision of the method is 4.7%; we tested the accuracy by analyzing one geological, international standard, which demonstrated good agreement between the standard and this technique. A new figure of glauconite GL-O boron content is given. Minimum detectable concentration is 11 μg/g B in rock sample.

Keywords: Analysis for boron; Arc d.c; Emission spectrography; Geological materials; Silicate materials

Document Type: Research Article


Affiliations: 1: Spectroscopy Laboratory, Barcelona University, Barcelona, Spain 2: Analytical Chemistry Department, Barcelona University, Barcelona, Spain

Publication date: July 1, 1984

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