Application of Fourier Transform Infrared Emission Spectrometry to Surface Analysis

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Abstract:

Infrared emission spectra of thin polymer layers on flat aluminum plate have been measured using Fourier transform infrared spectrometry. The detection limit of Fourier transform infrared emission spectrometry (FT-IR-EMS) was found to be comparable with that of Fourier transform infrared reflection absorption spectrometry (FT-IR-RAS) when an emission ray was collected at a viewing angle of 70°. The merits of FT-IR-EMS over FT-IR-RAS were demonstrated in the measurement of nonflat surfaces. The residual lubricant on steel tire cords could be detected efficiently by the FT-IR-EMS mode. The linear relationship found between the relative emission intensity and the thickness of film represents the possibility for a quantitative analysis of a thin overlayer on metal surface.

Keywords: Fourier transform infrared spectroscopy; Infrared emission spectrum; Surface analysis

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702844554215

Affiliations: Toray Research Center, Inc., Sonoyama, 1-1, 1-Chome, Otsu, Shiga 520 Japan

Publication date: March 1, 1984

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