"Quantitative" Electron Probe Analysis of Low-Atomic-Number Samples with Irregular Surfaces

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The quantitative electron probe analysis on irregular surfaces via the two-voltage technique was assessed for light elements. This analysis can be performed without the knowledge of the local tilt angle, i.e., the take-off angle. Data are presented of compositions determined on crystal facets with widely varied orientations with respect to the detector. A range of model compounds and commercial products was investigated with special emphasis on those consisting of low-atomic-number elements. The usefulness of the technique, its disadvantages, and limitations are critically evaluated. The precision and accuracy obtainable in routine laboratory work are quantified and the effect of the selection of the accelerating voltage pairs and magnification is discussed.

Keywords: Electron microprobe

Document Type: Research Article

DOI: http://dx.doi.org/10.1366/0003702834634127

Affiliations: Stauffer Chemical Company, Livingstone Avenue, Dobbs Ferry, New York 10522

Publication date: January 1, 1983

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